XRF (or X-ray fluorescence spectrometry) is a non-destructive, qualitative and quantitative elemental analysis technique for minerals, pigments and alloys.
It can be used to determine the chemical composition of a wide variety of sample types and can identify the major elements present in a solid or powder sample. It is also used to determine the thickness and composition of pictorial layer.
This technique is based on the principle of X-ray fluorescence: when a large quantity of X-rays (emitted by an excitation source) is sent onto the surface of a sample, they are reflected, making each element on the surface react in a characteristic way. These rays are then recovered by the detector and processed to produce an X-ray fluorescence spectrum.
This analysis technique allows the characterization of materials: determination of the different phases (chemical composition, crystalline structure) and description of the microstructure (grain size, texture, imperfections of the networks…).
X-ray fluorescence spectrometry allows the identification of crystallized phases, gives structural information for inorganic materials and allows the characterization of pigments, oxides, etc.